[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Study of Si nanocrystal growth and characterization for Si nanocrystal embeded nonvolatile memory
Liu, Bo, Huang, Maggie Yamin, Tan, P. K., Song, Zhen, Mai, Zhihong, Lam, JeffreyРік:
2017
Мова:
english
DOI:
10.1109/IPFA.2017.8060149
Файл:
PDF, 529 KB
english, 2017
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