Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes
Loayza, Jorge, Guitard, Nicolas, Allard, Bruno, Phung, Luong Viêt, Jacquier, Blaise, Galy, PhilippeТом:
85
Мова:
english
Журнал:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.04.013
Date:
June, 2018
Файл:
PDF, 5.46 MB
english, 2018
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