Influence of Paralleling Dies and Paralleling Half-Bridges on Transient Current Distribution in Multichip Power Modules
Li, Helong, Zhou, Wei, Wang, Xiongfei, Munk-Nielsen, Stig, Li, Daohui, Wang, Yangang, Dai, XiaopingТом:
33
Мова:
english
Журнал:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2018.2797326
Date:
August, 2018
Файл:
PDF, 778 KB
english, 2018