[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Detailed analysis of frequency-dependent impedance in pseudo-MOSFET on thin SOI film
Sato, S., Omura, Y., Ghibaudo, G., Benea, L., Cristoloveanu, S.Рік:
2018
Мова:
english
DOI:
10.1109/ULIS.2018.8354774
Файл:
PDF, 461 KB
english, 2018