[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Weibull cumulative distribution function (CDF) analysis with life expectancy endurance test result of power window switch
Lee, Miky, Kim, K., Lim, D., Cho, D., Han, Ck.Рік:
2018
Мова:
english
DOI:
10.1109/IRPS.2018.8353694
Файл:
PDF, 2.66 MB
english, 2018