[IEEE 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Taormina, Italy (2018.4.9-2018.4.12)] 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers
Floridia, A., Piumatti, D., Sanchez, E., De Luca, S., Sansonetti, A.Рік:
2018
Мова:
english
DOI:
10.1109/DTIS.2018.8368558
Файл:
PDF, 842 KB
english, 2018
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