Investigation on microstructure evolution and failure mechanism of boron doped diamond coated titanium electrode during accelerated life test
Lu, Xin-Ru, Ding, Ming-Hui, Zhang, Cong, Tang, Wei-ZhongТом:
660
Мова:
english
Журнал:
Thin Solid Films
DOI:
10.1016/j.tsf.2018.06.039
Date:
August, 2018
Файл:
PDF, 2.20 MB
english, 2018
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