Stability of multiple Shockley type basal plane stacking faults in heavily nitrogen-doped 4H-SiC crystals
Mannen, Yuina, Shimada, Kana, Taniguchi, Chisato, Ohtani, NoboruМова:
english
Журнал:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2018.06.029
Date:
July, 2018
Файл:
PDF, 1.36 MB
english, 2018