Fast Bi-dimensional empirical mode decomposition as an image enhancement technique for fruit defect detection
Lu, Yuzhen, Lu, RenfuТом:
152
Мова:
english
Журнал:
Computers and Electronics in Agriculture
DOI:
10.1016/j.compag.2018.07.025
Date:
September, 2018
Файл:
PDF, 1.83 MB
english, 2018
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