Steps length error detector algorithm in phase-shifting interferometry using Radon transform as a profile measurement
Ramirez-delreal, Tania A., Mora-Gonzalez, Miguel, Casillas-Rodriguez, Francisco J., Muñoz-Maciel, Jesus, Paz, Marco A.Том:
25
Мова:
english
Журнал:
Optics Express
DOI:
10.1364/oe.25.007150
Date:
March, 2017
Файл:
PDF, 2.35 MB
english, 2017