Graphene used as a lateral force microscopy calibration material in the low-load non-linear regime
Boland, Mathias J., Hempel, Jacob L., Ansary, Armin, Nasseri, Mohsen, Strachan, Douglas R.Том:
89
Мова:
english
Журнал:
Review of Scientific Instruments
DOI:
10.1063/1.5044727
Date:
November, 2018
Файл:
PDF, 2.94 MB
english, 2018