Conduction mechanisms of the reverse leakage current of 4H-SiC Schottky barrier diode
Latreche, AbdelhakimМова:
english
Журнал:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aaf8cb
Date:
December, 2018
Файл:
PDF, 1.86 MB
english, 2018