Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy
Brown, H.G., Ishikawa, R., Sanchez-Santolino, G., Shibata, N., Ikuhara, Y., Allen, L.J., Findlay, S.D.Мова:
english
Журнал:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2018.12.010
Date:
December, 2018
Файл:
PDF, 9.14 MB
english, 2018