Copula based constant-stress PALT using tampered failure rate model with dependent competing risks
Srivastava, Preeti Wanti, Gupta, TanuМова:
english
Журнал:
International Journal of Quality & Reliability Management
DOI:
10.1108/IJQRM-08-2017-0170
Date:
February, 2019
Файл:
PDF, 345 KB
english, 2019
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