Probing vacancy behavior across complex oxide heterointerfaces
Zhu, Jiaxin, Lee, Jung-Woo, Lee, Hyungwoo, Xie, Lin, Pan, Xiaoqing, De Souza, Roger A., Eom, Chang-Beom, Nonnenmann, Stephen S.Том:
5
Мова:
english
Журнал:
Science Advances
DOI:
10.1126/sciadv.aau8467
Date:
February, 2019
Файл:
PDF, 725 KB
english, 2019