[IEEE 2018 IEEE International Test Conference in Asia (ITC-Asia) - Harbin (2018.8.15-2018.8.17)] 2018 IEEE International Test Conference in Asia (ITC-Asia) - Low-Distortion One-Tone and Two-Tone Signal Generation Using AWG Over Full Nyquist Region
Yanagida, Tomonori, Shibuya, Shohei, Machida, Kosuke, Asami, Koji, Kobayashi, HaruoРік:
2018
Мова:
english
DOI:
10.1109/ITC-Asia.2018.00026
Файл:
PDF, 2.75 MB
english, 2018