[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Applying Machine Learning to Design for Reliability Coverage
Chang, Norman, Chuang, Wentze, Tsavatanalli, Ganesh Kumar, Geada, Joao, Zhuang, Hao, Ramachandran, Sankar, Raian, Rahul, Li, Ying-Shiun, Jia, Yaowei, Kaipanatu, Mathew, Mantena, Suresh Kumar, Shih, MiРік:
2019
Мова:
english
DOI:
10.1109/IRPS.2019.8720569
Файл:
PDF, 753 KB
english, 2019
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