[IEEE 2019 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2019.3.18-2019.3.19)] 2019 China Semiconductor Technology International Conference (CSTIC) - Investigation on LDMOS Characteristics of Layout Dependence in FinFET Technology
Wang, Gang, Lee, Byunghak, Ma, Guiying, Wang, Nan, Tang, Mike, Ding, Kellin, zhou, Breeze, Ju, JianhuaРік:
2019
DOI:
10.1109/CSTIC.2019.8755646
Файл:
PDF, 1.35 MB
2019
File converter
Більше результатів пошуку
More benefits 
