[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Cycling Induced Trap Generation and Recovery Near the Top Select Gate Transistor in 3D NAND
Zou, Xingqi, Yan, Liang, Jin, Lei, Li, Da, Xu, Feng, Ai, Di, Zhang, An, Liu, Hongtao, Wang, Ming, Li, Wei, Song, Yali, Wei, Huazheng, Chen, Yi, Li, Chunlong, Huo, ZongliangРік:
2019
Мова:
english
DOI:
10.1109/IRPS.2019.8720607
Файл:
PDF, 856 KB
english, 2019
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