[IEEE 2019 ACM/IEEE Joint Conference on Digital Libraries (JCDL) - Champaign, IL, USA (2019.6.2-2019.6.6)] 2019 ACM/IEEE Joint Conference on Digital Libraries (JCDL) - Extracting Pest Risk Information from Risk Assessment Documents
Glen, Newton, Korol, Oksana, Andre, Levesque, Robert, Favrin, Tom, GraefenhamРік:
2019
Мова:
english
DOI:
10.1109/JCDL.2019.00074
Файл:
PDF, 12 KB
english, 2019