[IEEE 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2019.5.28-2019.5.31)] 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Automatic Transient Thermal Impedance Tester for Quality Inspection of Soldered and Sintered Power Electronic Devices on Panel and Tile Level
Schmid, Maximilian, Krishna, Bhogaraju Sri, Elger, GordonРік:
2019
DOI:
10.1109/ectc.2019.00320
Файл:
PDF, 773 KB
2019
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