Terrestrial neutron-induced single events in GaN
Munteanu, D., Autran, J.L.Том:
100-101
Мова:
english
Журнал:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.06.049
Date:
September, 2019
Файл:
PDF, 1.89 MB
english, 2019