Development and characterization of a new 1BL.1RS translocation line with resistance to stripe rust and powdery mildew of wheat
Tian-Heng Ren, Zu-Jun Yang, Ben-Ju Yan, Huai-Qiong Zhang, Shu-Lan Fu, Zheng-Long RenТом:
169
Мова:
english
Сторінки:
7
DOI:
10.1007/s10681-009-9924-5
Date:
September, 2009
Файл:
PDF, 197 KB
english, 2009