[IEEE 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2019.5.28-2019.5.31)] 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - A Methodology to Correct in-Fixture Measurement of Impedance by a Machine Learning Model
Fang, Bo-Siang, Lai, Chia-Chu, Lu, Ying-Wei, Chen, Kuan-Ta, Tasi, Mike, Jiang, Don-SonРік:
2019
DOI:
10.1109/ectc.2019.00261
Файл:
PDF, 1.43 MB
2019
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