A review of demodulation techniques for multifrequency atomic force microscopy
Harcombe, David M, Ruppert, Michael G, Fleming, Andrew JТом:
11
Журнал:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.11.8
Date:
January, 2020
Файл:
PDF, 6.34 MB
2020