AIP Conference Proceedings [AIP Publishing PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS: ICAM 2019 - Kerala, India (12–14 June 2019)] PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS: ICAM 2019 - Non - destructive method for thickness measurement of dielectric films using metamaterial resonator
Sebastian, Anju, Davis, Denet, Simon, Sikha K., Chakyar, Sreedevi P., Jose, Jovia, Kizhakooden, Joe, Paul, Nees, Bindu, C., Joseph, V. P., Andrews, JollyТом:
2162
Рік:
2019
Мова:
english
DOI:
10.1063/1.5130351
Файл:
PDF, 1.40 MB
english, 2019
File converter
Більше результатів пошуку
More benefits 
