Investigation of the Effect of Thermal Annealing on the Electrical Properties of the Near-Surface Layer of MBE n-HgCdTe Using MIS Techniques
Voitsekhovskii, A. V., Nesmelov, S. N., Dzyadukh, S. M., Varavin, V. S., Dvoretsky, S. A., Mikhailov, N. N., Sidorov, G. Y., Yakushev, M. V., Marin, D. V.Журнал:
Journal of Electronic Materials
DOI:
10.1007/s11664-020-08005-0
Date:
February, 2020
Файл:
PDF, 1.88 MB
2020