Chatter Detection and Diagnosis in Hot Strip Mill Process with a Frequency-based Chatter Index and Modified Independent Component Analysis
Jo, Ha-Nui, Park, Byeong Eon, Ji, Yumi, Kim, Dong-Kuk, Yang, Jeong Eun, Lee, In-BeumРік:
2020
Мова:
english
Журнал:
IEEE Transactions on Industrial Informatics
DOI:
10.1109/TII.2020.2978526
Файл:
PDF, 894 KB
english, 2020
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