Temperature-Driven Gate Geometry Effects in Nanoscale Cryogenic MOSFETs
Wang, Zewei, Tang, Zhidong, Guo, Ao, Luo, Xin, Cao, Chengwei, Yuan, Yumeng, Zhang, Xiuhao, Liu, Lingge, Li, Jialun, Cao, Yongfeng, Shao, Qiming, Hu, Shaojian, Chen, Shoumian, Zhao, Yuhang, Kou, XufengРік:
2020
Мова:
english
Журнал:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.2984280
Файл:
PDF, 604 KB
english, 2020