Digital 3d x-ray microtomographic scanners for electronic equipment testing
Klestov, S A, Kuznetsov, D N, Suntsov, S BТом:
516
Журнал:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/516/1/012026
Date:
April, 2019
Файл:
PDF, 433 KB
2019