X-ray Computed Tomography InstrumentPerformance Evaluation, Part I: Sensitivity to Detector Geometry Errors
Muralikrishnan, Bala, Shilling, Megan, Phillips, Steve, Ren, Wei, Lee, Vincent, Kim, FelixТом:
124
Журнал:
Journal of Research of the National Institute of Standards and Technology
DOI:
10.6028/jres.124.014
Date:
July, 2019
Файл:
PDF, 2.59 MB
2019
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