[IEEE 2020 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON) - Phuket, Thailand (2020.6.24-2020.6.27)] 2020 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON) - Stylometry as a Reliable Method for Fallback Authentication
Sadman, Nafiz, Datta Gupta, Kishor, Haque, Md Ariful, Sen, Sajib, Poudyal, SubashРік:
2020
DOI:
10.1109/ECTI-CON49241.2020.9158216
Файл:
PDF, 1.40 MB
2020
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