[IEEE 2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO) - Montreal, QC, Canada (2020.7.29-2020.7.31)] 2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO) - TCAD Investigation of Gate - Lag Measurements on Conventional and Ï - Gate AlGaN/GaN HEMTs
Sehra, Khushwant, Kumari, Vandana, Gupta, Mridula, Mishra, Meena, Rawal, D. S., Saxena, ManojРік:
2020
DOI:
10.1109/NANO47656.2020.9183484
Файл:
PDF, 1.34 MB
2020
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