Image-Based Machine Learning Characterizes Root Nodule in Soybean Exposed to Silicon
Chung, Yong Suk, Lee, Unseok, Heo, Seong, Silva, Renato Rodrigues, Na, Chae-In, Kim, YoonhaТом:
11
Журнал:
Frontiers in Plant Science
DOI:
10.3389/fpls.2020.520161
Date:
October, 2020
Файл:
PDF, 3.08 MB
2020