[IEEE 2020 IEEE International Conference on Image Processing (ICIP) - Abu Dhabi, United Arab Emirates (2020.10.25-2020.10.28)] 2020 IEEE International Conference on Image Processing (ICIP) - CAM-UNET: Class Activation MAP Guided UNET with Feedback Refinement for Defect Segmentation
Lin, Dongyun, Li, Yiqun, Prasad, Shitala, Nwe, Tin Lay, Dong, Sheng, Oo, Zaw MinРік:
2020
DOI:
10.1109/icip40778.2020.9190900
Файл:
PDF, 196 KB
2020