[IEEE 2020 IEEE XXVII International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Lima, Peru (2020.9.3-2020.9.5)] 2020 IEEE XXVII International Conference on Electronics, Electrical Engineering and Computing (INTERCON) - Millimeter-Wave Line-of-Sight Probability Modeling for Inside Metro Carriages Scenarios
Ulloa, Carlos, Luque, Jenny, Clemente-Arenas, Mark, Inca, SaulРік:
2020
DOI:
10.1109/intercon50315.2020.9220204
Файл:
PDF, 1.37 MB
2020
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