[IEEE 2020 International Conference on Artificial Intelligence and Electromechanical Automation (AIEA) - Tianjin, China (2020.6.26-2020.6.28)] 2020 International Conference on Artificial Intelligence and Electromechanical Automation (AIEA) - Bayesian Estimations of Reliability on One Type of Missile with Zero-Failure Data
Hu, Wenlin, Sun, Chenfeng, Li, DongbingРік:
2020
DOI:
10.1109/aiea51086.2020.00048
Файл:
PDF, 247 KB
2020