Determining the base resistance of InP HBTs: An evaluation of methods and structures
Nardmann, Tobias, Krause, Julia, Pawlak, Andreas, Schroter, MichaelТом:
123
Мова:
english
Журнал:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.06.002
Date:
September, 2016
Файл:
PDF, 885 KB
english, 2016